Volume 51, Issue suppl_1
27 March 2002
This issue was originally published in
Journal of Electron Microscopy
ISSN 0022-0744
EISSN 1477-9986
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Volume 51, Issue suppl_1, 27 March 2002
Preface
Preface
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Page S1, https://doi.org/10.1093/jmicro/51.Supplement.S1
Full-length Paper
First principles calculation of ELNES by LCAO methods
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S107–S112, https://doi.org/10.1093/jmicro/51.Supplement.S107
High resolution X‐ray mapping in the STEM
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S113–S126, https://doi.org/10.1093/jmicro/51.Supplement.S113
Application of a JEM‐2010FEF FEG‐AEM for elemental analysis of microstructures in heat‐resisting Cr steel
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S127–S134, https://doi.org/10.1093/jmicro/51.Supplement.S127
In situ and ex situ electron microscopy studies of polar oxide surfaces with rock‐salt structure
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S13–S25, https://doi.org/10.1093/jmicro/51.Supplement.S13
TEM and AEM observation of high‐strain‐rate superplastic ceramics, CaO‐/TiO2‐doped and CaO‐/SiO2‐doped (3Y)ZrO2 polycrystals
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S135–S141, https://doi.org/10.1093/jmicro/51.Supplement.S135
Electron microscopy study on Mo content dependence of β to ω phase transformation due to cooling in Ti–Mo alloys
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S143–S147, https://doi.org/10.1093/jmicro/51.Supplement.S143
Electron microscopic observation of interfaces of aluminium powder compacts prepared by spark plasma sintering
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S149–S153, https://doi.org/10.1093/jmicro/51.Supplement.S149
Dark‐field and bright‐field imaging of charge order domains in Nd0.5Ca0.5(Mn0.98Cr0.02)O3
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S155–S158, https://doi.org/10.1093/jmicro/51.Supplement.S155
HREM and EDS analysis of sintered SiC fibre reinforced MAS glass composites
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S159–S164, https://doi.org/10.1093/jmicro/51.Supplement.S159
High‐resolution electron microscopy of stacking faults in heteroepitaxial ZnO/LiTaO3
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S165–S169, https://doi.org/10.1093/jmicro/51.Supplement.S165
Transmission electron microscopy analysis of interfacial layers in Ti/Ta/Al ohmic contacts to n‐AlGaN
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S171–S174, https://doi.org/10.1093/jmicro/51.Supplement.S171
Melting and crystallization of Xe nanoprecipitates in Al under 1 MeV electron irradiation
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S175–S181, https://doi.org/10.1093/jmicro/51.Supplement.S175
In situ TEM observation of nucleation and growth of spherical graphitic clusters under ion implantation
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S183–S187, https://doi.org/10.1093/jmicro/51.Supplement.S183
The role of lattice defects in the formation of new carbon structures under electron irradiation
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S189–S194, https://doi.org/10.1093/jmicro/51.Supplement.S189
Implantation of Au atoms into Al matrix by MeV electron irradiation
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S195–S200, https://doi.org/10.1093/jmicro/51.Supplement.S195
Nanoscale lead‐tin inclusions in aluminium
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S201–S209, https://doi.org/10.1093/jmicro/51.Supplement.S201
Dynamic process of nano‐structured inert gas precipitates introduced with ion implantation in aluminium
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S211–S214, https://doi.org/10.1093/jmicro/51.Supplement.S211
Amorphous‐like nanostructures stabilized in nanometre‐sized alloy clusters
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S215–S218, https://doi.org/10.1093/jmicro/51.Supplement.S215
Retracted: Ion‐beam‐induced structural changes in MgAl2O4 and TiO2
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S219–S224, https://doi.org/10.1093/jmicro/51.Supplement.S219
A study of the mechanism of the growth and shrinkage of stacking fault tetrahedra using the fluctuation of their size under electron irradiation
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S225–S229, https://doi.org/10.1093/jmicro/51.Supplement.S225
Temperature effect on ion irradiation‐induced phase transformation in 304 stainless steel
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S231–S234, https://doi.org/10.1093/jmicro/51.Supplement.S231
Defect structure of high‐Tc superconductor by high‐energy heavy ion irradiation
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S235–S238, https://doi.org/10.1093/jmicro/51.Supplement.S235
Microstructural development and swelling behaviour of F82H steel irradiated by dual ion beams
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S239–S243, https://doi.org/10.1093/jmicro/51.Supplement.S239
Quantitative study of Brownian motion of helium bubbles in fcc metals
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S245–S251, https://doi.org/10.1093/jmicro/51.Supplement.S245
Design of a remote operation system for trans‐Pacific microscopy via international advanced networks
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S253–S257, https://doi.org/10.1093/jmicro/51.Supplement.S253
Bamboo‐like boron nitride nanotubes
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S259–S263, https://doi.org/10.1093/jmicro/51.Supplement.S259
Atomic and electronic structure analysis of Σ = 3 incoherent twin boundaries in β‐SiC
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S265–S270, https://doi.org/10.1093/jmicro/51.Supplement.S265
In situ real‐time environmental TEM of gas phase Ziegler–Natta catalytic polymerization of propylene
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S27–S39, https://doi.org/10.1093/jmicro/51.Supplement.S27
Characterization of the microstructure in CMR materials by HREM
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S271–S278, https://doi.org/10.1093/jmicro/51.Supplement.S271
Quantification of lattice images: the contribution from diffuse scattering
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S279–S287, https://doi.org/10.1093/jmicro/51.Supplement.S279
Lorentz microscopy of vortices in superconductors
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S3–S11, https://doi.org/10.1093/jmicro/51.Supplement.S3
HRTEM observation of BN films segregated on stainless steel SUS304 by low temperature heat treatment
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S41–S44, https://doi.org/10.1093/jmicro/51.Supplement.S41
Structural observation of Pd silicide islands on Si (111) surfaces with UHV‐TEM/STM
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S45–S49, https://doi.org/10.1093/jmicro/51.Supplement.S45
First application of a spherical‐aberration corrected transmission electron microscope in materials science
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S51–S58, https://doi.org/10.1093/jmicro/51.Supplement.S51
Characterization of oxygen ordering in (La, Sr)FeO3 – δ by atomic resolution Z‐contrast imaging and electron energy‐loss spectroscopy
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S59–S66, https://doi.org/10.1093/jmicro/51.Supplement.S59
Quantitative electron incoherent scattering and application to nanometre‐sized charge ordering in La2/3Ca1/3MnO3
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S67–S72, https://doi.org/10.1093/jmicro/51.Supplement.S67
Phase‐shift and phase‐contrast images of pancake superconducting vortices
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S73–S77, https://doi.org/10.1093/jmicro/51.Supplement.S73
Measuring the Young's modulus of solid nanowires by in situ TEM
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S79–S85, https://doi.org/10.1093/jmicro/51.Supplement.S79
Quantitative evaluation of zero‐loss and core‐loss images by using EF‐TEM
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S87–S96, https://doi.org/10.1093/jmicro/51.Supplement.S87
TEM/EELS analysis of heat‐treated carbon nanotubes: experimental techniques
Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S97–S105, https://doi.org/10.1093/jmicro/51.Supplement.S97
