1-20 of 25
Authors: Scott D Findlay
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Journal Article
Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements Free
Marcel Schloz and others
Microscopy and Microanalysis, Volume 31, Issue 1, February 2025, ozae110, https://doi.org/10.1093/mam/ozae110
Published: 18 November 2024
Journal Article
Unsupervised Deep Denoising of Four-Dimensional Scanning Transmission Electron Microscopy Free
Alireza Sadri and others
Microscopy and Microanalysis, Volume 30, Issue Supplement_1, July 2024, ozae044.950, https://doi.org/10.1093/mam/ozae044.950
Published: 24 July 2024
Journal Article
Exploring Inelastic Differential Phase Contrast Imaging for Inner-shell Ionization Free
Michael Deimetry and others
Microscopy and Microanalysis, Volume 30, Issue Supplement_1, July 2024, ozae044.905, https://doi.org/10.1093/mam/ozae044.905
Published: 24 July 2024
Journal Article
Determining the Projected Crystal Structure from Four-dimensional Scanning Transmission Electron Microscopy via the Scattering Matrix Open Access
Alireza Sadri and Scott D Findlay
Microscopy and Microanalysis, Volume 29, Issue 3, June 2023, Pages 967–982, https://doi.org/10.1093/micmic/ozad018
Published: 16 May 2023
Journal Article
The Effect of Dynamical Scattering on Single-plane Phase Retrieval in Electron Ptychography Open Access
Laura Clark and others
Microscopy and Microanalysis, Volume 29, Issue 1, February 2023, Pages 384–394, https://doi.org/10.1093/micmic/ozac022
Published: 20 December 2022
Journal Article
A Three-Dimensional Reconstruction Algorithm for Scanning Transmission Electron Microscopy Data from a Single Sample Orientation
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Hamish G Brown and others
Microscopy and Microanalysis, Volume 28, Issue 5, 1 October 2022, Pages 1632–1640, https://doi.org/10.1017/S1431927622012090
Published: 01 October 2022
Journal Article
Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus Value
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Scott D Findlay and others
Microscopy and Microanalysis, Volume 27, Issue 4, 1 August 2021, Pages 744–757, https://doi.org/10.1017/S1431927621000490
Published: 01 August 2021
Journal Article
Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale Open Access
Katherine E MacArthur and others
Microscopy and Microanalysis, Volume 27, Issue 3, 1 June 2021, Pages 528–542, https://doi.org/10.1017/S1431927621000246
Published: 01 June 2021
Journal Article
Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast Imaging
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Budhika G Mendis and others
Microscopy and Microanalysis, Volume 26, Issue 6, 1 December 2020, Pages 1147–1157, https://doi.org/10.1017/S1431927620024605
Published: 01 December 2020
Journal Article
Pushing the Limits of Absolute Scale Energy Dispersive X-ray Quantification
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Katherine E MacArthur and others
Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 968–969, https://doi.org/10.1017/S1431927619005579
Published: 01 August 2019
Journal Article
Probing the Effects of Electron Channelling on EDX Quantification
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Katherine E MacArthur and others
Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 392–393, https://doi.org/10.1017/S1431927617002641
Published: 04 August 2017
Journal Article
Three-Dimensional Point Defect Imaging by Large-angle Illumination STEM
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Ryo Ishikawa and others
Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 424–425, https://doi.org/10.1017/S143192761700280X
Published: 04 August 2017
Journal Article
Quantitative Atomic Resolution Differential Phase Contrast Imaging Using a Segmented Area All Field Detector
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Gabriel Sanchez-Santolino and others
Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 504–505, https://doi.org/10.1017/S1431927616003378
Published: 25 July 2016
Journal Article
Making every electron count: materials characterization by quantitative analytical scanning transmission electron microscopy
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Matthew Weyland and others
Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 1430–1431, https://doi.org/10.1017/S1431927616007996
Published: 25 July 2016
Journal Article
Facilitating Quantitative Analysis of Atomic Scale 4D STEM Datasets
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Zhen Chen and others
Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 474–475, https://doi.org/10.1017/S1431927616003226
Published: 25 July 2016
Journal Article
Quantitative Electron Microscopy and the Application by Single Electron Signals
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Ryo Ishikawa and others
Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1449–1450, https://doi.org/10.1017/S1431927615008028
Published: 23 September 2015
Journal Article
Dopant Quantification by Atomic-scale Energy Dispersive X-ray Analysis
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Zhen Chen and others
Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 819–820, https://doi.org/10.1017/S1431927615004894
Published: 23 September 2015
Journal Article
Absolute-Scale Quantitative Energy Dispersive X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopy
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Zhen Chen and others
Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1079–1080, https://doi.org/10.1017/S1431927615006182
Published: 23 September 2015
Journal Article
Annular Bright Field Scanning Transmission Electron Microscopy - Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials
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Scott D Findlay
Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1939–1940, https://doi.org/10.1017/S1431927615010478
Published: 23 September 2015
Journal Article
Accurate Nanoscale Crystallography in Real-Space Using Scanning Transmission Electron Microscopy
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J Houston Dycus and others
Microscopy and Microanalysis, Volume 21, Issue 4, 1 August 2015, Pages 946–952, https://doi.org/10.1017/S1431927615013732
Published: 14 July 2015
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