ML-1Past and Present of the Transmission Electron Microscopy. ~ Overview of 50 Years by One of the Materials Scientists ~ Get access

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HRTEM image contrast and atomistic microstructures of long-period ordered Al-rich TiAl alloys Get access

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Comparison of Detection Limits for Elemental Mapping by EF-TEM and STEMXEDS Get access

Strain Analysis of Si by FEM and Energy-Filtering CBED Get access

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Quantitative evaluation of zero‐loss and core‐loss images by using EF‐TEM Get access

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Application of a JEM‐2010FEF FEG‐AEM for elemental analysis of microstructures in heat‐resisting Cr steel Get access

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First electron spectroscopic imaging experiments on the new JEOL 2010 FEF Get access

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Applications of Convergent Beam Electron Diffraction to Extract Quantitative Information in Materials Science Get access

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Abstracts of Papers Presented at the Thirty-first Kyushu Regional Meeting of the Japanese Society of Electron Microscopy Get access

Application of Higher Order Laue Zone Patterns to Lattice Parameter Determination in Cu-based Alloys Get access

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Strain Contrast of Coherent Precipitates in Cu-Co Alloys under Excitation of High Order Reflections Get access

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