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Andrew B Yankovich, Jie Feng, Alex Kvit, Thomas Slater, Sarah Haigh, Dane Morgan, Paul M Voyles, Revealing New Atomic-scale Information about Materials by Improving the Quality and Quantifiability of Aberration-corrected STEM Data, Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 2409–2410, https://doi.org/10.1017/S1431927615012829
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