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Authors: Toshinari Ichihashi

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Energy‐filtered electron diffraction and high‐resolution electron microscopy on short‐range ordered structure in GaAs_0.5Sb_0.5 Get access

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Daisuke Shindo and others

Journal of Electron Microscopy, Volume 51, Issue 1, 15 March 2002, Pages 29–34, https://doi.org/10.1093/jmicro/51.1.29

Published: 15 March 2002

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Energy‐filtered electron diffraction and high‐resolution electron microscopy on short‐range ordered structure in GaAs0.5Sb0.5 Get access

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Energy‐filtered electron diffraction and high‐resolution electron microscopy on short‐range ordered structure in GaAs_0.5Sb_0.5 Get access