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Authors: Chang‐Woo Lee
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Journal Article
Microstructural characterization of Ni–22Fe–22Cr–6Al metallic foam by transmission electron microscopy
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Hyung Giun Kim and others
Journal of Electron Microscopy, Volume 61, Issue 5, October 2012, Pages 299–304, https://doi.org/10.1093/jmicro/dfs047
Published: 20 June 2012
Journal Article
Measurement of mean free paths for inelastic electron scattering of Si and SiO2
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Chang‐Woo Lee and others
Journal of Electron Microscopy, Volume 51, Issue 3, 28 May 2002, Pages 143–148, https://doi.org/10.1093/jmicro/51.3.143
Published: 28 May 2002
Journal Article
Energy‐filtered electron diffraction and high‐resolution electron microscopy on short‐range ordered structure in GaAs0.5Sb0.5
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Daisuke Shindo and others
Journal of Electron Microscopy, Volume 51, Issue 1, 15 March 2002, Pages 29–34, https://doi.org/10.1093/jmicro/51.1.29
Published: 15 March 2002
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