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Volume 72, Issue 4, August 2023
Special Feature: The Third Japan-Canada Microscopy Societies Joint Symposium 2022
In This Issue
In This Issue
Microscopy, Volume 72, Issue 4, August 2023, Pages 1–4, https://doi.org/10.1093/jmicro/dfad038
Special Feature: Editorial
The Third Japan–Canada Microscopy Societies Joint Symposium 2022
Ken Harada and Misa Hayashida
Microscopy, Volume 72, Issue 4, August 2023, Page 273, https://doi.org/10.1093/jmicro/dfad039
Special Feature: Reviews
Magnetization controlled by crystallization in soft magnetic Fe-Si-B-P-Cu alloys
Hiroshi Nakajima and others
Microscopy, Volume 72, Issue 4, August 2023, Pages 274–278, https://doi.org/10.1093/jmicro/dfac042
Correlative light and volume electron microscopy to study brain development
Shuichi Hayashi and others
Microscopy, Volume 72, Issue 4, August 2023, Pages 279–286, https://doi.org/10.1093/jmicro/dfad002
Development and applications of ultrafast transmission electron microscopy
T Shimojima and others
Microscopy, Volume 72, Issue 4, August 2023, Pages 287–298, https://doi.org/10.1093/jmicro/dfad021
Using elemental staining and mapping techniques for simultaneous visualization of biological structures in the nucleus by multichannel electron microscopy
Hilmar Strickfaden and others
Microscopy, Volume 72, Issue 4, August 2023, Pages 299–309, https://doi.org/10.1093/jmicro/dfad022
Review
Three-dimensional visualization of plant tissues and organs by X-ray micro–computed tomography
Ichirou Karahara and others
Microscopy, Volume 72, Issue 4, August 2023, Pages 310–325, https://doi.org/10.1093/jmicro/dfad026
Articles
Exploring the influence of focused ion beam processing and scanning electron microscopy imaging on solid-state electrolytes
Ziming Ding and others
Microscopy, Volume 72, Issue 4, August 2023, Pages 326–335, https://doi.org/10.1093/jmicro/dfac064
Single-molecule localization microscopy based on denoising, interpolation and local maxima
Tao Cheng
Microscopy, Volume 72, Issue 4, August 2023, Pages 336–342, https://doi.org/10.1093/jmicro/dfac065
Extraction of phase information approximating the demagnetization field within a thin-foiled magnet using electron holography observation
Sujin Lee and others
Microscopy, Volume 72, Issue 4, August 2023, Pages 343–352, https://doi.org/10.1093/jmicro/dfac066
Different atomic contrasts in HAADF images and EELS maps of rutile TiO2
Chisaki Iwashimizu and others
Microscopy, Volume 72, Issue 4, August 2023, Pages 353–360, https://doi.org/10.1093/jmicro/dfac067
Electron irradiation damage of amorphous epoxy resin at low electron doses
Kaname Yoshida and others
Microscopy, Volume 72, Issue 4, August 2023, Pages 361–367, https://doi.org/10.1093/jmicro/dfac068
Model-based deconvolution for particle analysis applied to a through-focus series of HAADF-STEM images
Tetsu Ohsuna and Keiichiro Oh-ishi
Microscopy, Volume 72, Issue 4, August 2023, Pages 368–380, https://doi.org/10.1093/jmicro/dfac070
Correction
Correction to: Advances in fluorescence microscopy for orthohantavirus research
Microscopy, Volume 72, Issue 4, August 2023, Page 381, https://doi.org/10.1093/jmicro/dfad013
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