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High-precision charge analysis in a catalytic nanoparticle by electron holography

Ryotaro Aso, Yoshihiro Midoh, Toshiaki Tanigaki and Yasukazu Murakami

Mini Abstract: This review introduces the latest advancements of high-precision charge analysis using electron holography and discuss mechanisms of charge transfer at the metal–support interface.

Mini Abstract Figure: Figure 2

Microscopy 2024 73:4 301--307; doi:10.1093/jmicro/dfae018

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Observation and quantitative analysis of dislocations in steel using electron channeling contrast imaging method with precise control of electron beam incident direction

Takashige Mori, Takafumi Amino, Chie Yokoyama, Shunsuke Taniguchi, Takayuki Yonezawa and Akira Taniyama

Mini Abstract: We conducted observation and quantitative analysis of dislocation contrast in steel materials in SEM/ECCI with precise control of electron beam direction. This method can be used for strain field around dislocation evaluation as well as the TEM method, and the depth information of dislocation contrast is deeper than 5ξg.

The number of the figure that represents in this manuscript is FigurA 7.

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