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In This Issue, Microscopy, Volume 73, Issue 4, August 2024, Pages 1–4, https://doi.org/10.1093/jmicro/dfae034
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High-precision charge analysis in a catalytic nanoparticle by electron holography
Ryotaro Aso, Yoshihiro Midoh, Toshiaki Tanigaki and Yasukazu Murakami
Mini Abstract: This review introduces the latest advancements of high-precision charge analysis using electron holography and discuss mechanisms of charge transfer at the metal–support interface.
Mini Abstract Figure: Figure 2
Microscopy 2024 73:4 301--307; doi:10.1093/jmicro/dfae018
Observation and quantitative analysis of dislocations in steel using electron channeling contrast imaging method with precise control of electron beam incident direction
Takashige Mori, Takafumi Amino, Chie Yokoyama, Shunsuke Taniguchi, Takayuki Yonezawa and Akira Taniyama
Mini Abstract: We conducted observation and quantitative analysis of dislocation contrast in steel materials in SEM/ECCI with precise control of electron beam direction. This method can be used for strain field around dislocation evaluation as well as the TEM method, and the depth information of dislocation contrast is deeper than 5ξg.
The number of the figure that represents in this manuscript is FigurA 7.