Abstract

We report firstly a chemical map by using electrons with an energy-loss corresponding to a specific peak of near-edge fine structure by an energy-filtering transmission electron microscopy technique. The specimens of PbCrO4 fine particles covered with amorphous SiO2 films were examined in the present experiment. The fine particles can be discriminated from the amorphous SiO2 films in the oxygen map by means of the different properties of the chemical bond around oxygen atoms in both materials. The possibility of distinguishing elements in different chemical states is a prominent advantage of chemical mapping compared to the ordinary elemental mapping.

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