Figure 4.
Measured X-ray total scattering diffraction patterns for amorphous MgSiO3. (a) As manufactured (i.e. dried at 75°C); (b) annealed at 300; (c) 600 and (d) 900°C.
Measured X-ray total scattering diffraction patterns for amorphous MgSiO3. (a) As manufactured (i.e. dried at 75°C); (b) annealed at 300; (c) 600 and (d) 900°C.
