Glitch statistics as a function of the degree of smoothing for the spin-down experiment in Fig. 4. Left: pdf of fractional glitch sizes p(ΔΩ/Ω), binned logarithmically and graphed on log–log axes, for top-hat window functions of width Δt_sm = 0.0, 1.0, 5.0 and 10 (solid, dotted, dashed, dot–dashed curves, respectively). Right: cumulative distribution of glitch waiting times P(Δt) for top-hat window functions of width Δt_sm = 0.0, 1.0, 5.0 and 10 (solid, dotted, dashed, dot–dashed curves, respectively), graphed on linear axes. Simulation parameters: V₀ = 16.6, η = 1, ΔV_i/V₀ = 0.0, R = 12.5, Δx = 0.15, Δt = 5 × 10⁻⁴, N_EM/I_c = 10⁻³, Ω(t = 0) = 0.8, n_pin/n_F = 0.97.